The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2015
Filed:
Mar. 15, 2012
Walter Nistico, Berlin, DE;
Jan Hoffmann, Berlin, DE;
Eberhard Schmidt, Kleinmachnow, DE;
Abstract
The invention relates to an optical measuring device () for capturing at least one parameter of at least one eye () of a test person () wearing the optical measuring device (), comprising a frame (), at least one frame insert () attached to the frame () and at least one capturing unit (), wherein the frame () is designed to fix the optical measuring device () in such a way to the head of the test person (), that the at least one frame insert () is positioned in front of at least one eye () of the test person () for at least one direction of view of the at least one eye () on the optical axis (K) of the at least one eye (), and the capturing unit () is designed to optically capture the at least one parameter of the at least one eye (), wherein the capturing unit () is arranged in such a way (a) that the optical path (M) for the capturing of the at least one parameter of the at least one eye () excludes the frame insert ().