The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2015
Filed:
Mar. 12, 2012
Vipin Gupta, Bangalore, IN;
Caifeng Shan, Eindhoven, NL;
Pallavi Vajinepalli, Bangalore, IN;
Payal Keswarpu, Bangalore, IN;
Marinus Bastiaan Van Leeuwen, Eindhoven, NL;
Celine Firtion, Surat, IN;
Shankar Mosur Venkatesan, Bangalore, IN;
Jelte Peter Vink, Waaire, NL;
Vipin Gupta, Bangalore, IN;
Caifeng Shan, Eindhoven, NL;
Pallavi Vajinepalli, Bangalore, IN;
Payal Keswarpu, Bangalore, IN;
Marinus Bastiaan Van Leeuwen, Eindhoven, NL;
Celine Firtion, Surat, IN;
Shankar Mosur Venkatesan, Bangalore, IN;
Jelte Peter Vink, Waaire, NL;
Koninklijke Philips N.V., Eindhoven, NL;
Abstract
The invention provides for a medical instrument for examining the cervix comprising an optical examination system, a processor for controlling the medical instrument, and a memory containing machine executable instructions. Execution of the instructions causes the processor to: acquire a cervical image using the optical examination system; calculate a set of interest point locations using a digital filter; calculate a filtered set of interest point locations using the set of interest point locations and a morphological filter; calculate a reduced set of interest points locations using the filtered set of interest point locations and a neighborhood based filter; calculate a classified set of interest point locations reduced set of interest points and a trained classification module; calculate a set of punctation locations using the classified set of interest point locations and a second neighborhood based filter; and calculate punctation mark regions using the punctation point locations.