The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 2015

Filed:

Apr. 17, 2007
Applicants:

Michael Burcher, Cambridge, GB;

Jean-luc Robert, White Plains, NY (US);

Inventors:

Michael Burcher, Cambridge, GB;

Jean-Luc Robert, White Plains, NY (US);

Assignee:

Koninklijke Philips N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 8/00 (2006.01); A61B 8/14 (2006.01); A61B 8/12 (2006.01); G01S 7/52 (2006.01);
U.S. Cl.
CPC ...
A61B 8/00 (2013.01); A61B 8/12 (2013.01); G01S 7/52046 (2013.01); G01S 7/52095 (2013.01);
Abstract

An ultrasonic diagnostic imaging system produces an image with an extended focal range by transmitting a plurality of beams spaced along an array for multiline reception. The receive multilines of a plurality of transmit beams are spatially aligned and are combined with phase adjustment between the respective receive multilines to prevent undesired phase cancellation. The combined multilines produce the effect of an extended transmit focus so that an image produced using the combined multilines exhibits an extended focal range. To prevent motion artifacts the multiline order is adjustable as a function of image motion.


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