The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2015

Filed:

Dec. 15, 2014
Applicant:

Broadcom Corporation, Irvine, CA (US);

Inventor:

Amir Appel, Kfar-Saba, IL;

Assignee:

Broadcom Corporation, Irvine, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 36/00 (2009.01); H04W 84/18 (2009.01); H04W 24/02 (2009.01); H04W 16/16 (2009.01); H04W 56/00 (2009.01);
U.S. Cl.
CPC ...
H04W 36/0072 (2013.01); H04W 36/0055 (2013.01); H04W 16/16 (2013.01); H04W 24/02 (2013.01); H04W 56/001 (2013.01); H04W 84/18 (2013.01);
Abstract

A base station can observe downlink communications of neighboring base stations of neighboring cells to determine operational parameters of these neighboring base stations in a process called sniffing. The base station ceases downlink transmission and/or uplink reception and initiates downlink reception for a duration in time and/or over frequency to form a sniffing window to observe the downlink communications of the one or more neighboring base stations. The sniffing window represents an area in time and/or frequency where downlink communications are not transmitted. The base station determines operational parameters based upon the downlink communications of the one or more neighboring base stations that are observed during the sniffing window. The base station and/or the one or more neighboring base stations can adjust their respective operational parameters such that, on average, each of the base stations within the cellular network should have a substantially similar deviation in their operational parameters.


Find Patent Forward Citations

Loading…