The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2015
Filed:
May. 09, 2014
Teledyne Dalsa Inc., Waterloo, CA;
Naser Faramarzpour, Kitchener, CA;
Teledyne DALSA, Inc., Waterloo, CA;
Abstract
A system and method for limiting fixed pattern noise (FPN) in a time delay and integration (TDI) mode of operation of a complementary metal oxide semiconductor (CMOS) imaging device is disclosed. The system and method provide for each line time, selecting a pixel for each column of photosensitive elements in the along track direction to capture dark information such that the selected pixel does not correspond to a portion of a scene that was previously selected to capture dark information in a current TDI period. The dark information for the selected pixels is captured and summed for each column of photosensitive elements. This sum is then used during a next TDI time period to subtract FPN effects from the output of the corresponding column. This allows the dark sum information to be constantly updated while the image sensor is in use while only decreasing the responsitivity by (N−1)/N relative to an N pixel column of a traditional TDI operation.