The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2015
Filed:
Jul. 20, 2012
Applicants:
Weining Tan, Mississauga, CA;
Steven Charles Read, Mississauga, CA;
Matthew O'dor, Toronto, CA;
Inventors:
Assignee:
IMAX Corporation, Mississauga, ON, unknown;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 17/00 (2006.01); H04N 17/02 (2006.01); H04N 5/21 (2006.01); H04N 13/00 (2006.01); H04N 13/04 (2006.01); H04N 9/31 (2006.01); G06T 7/00 (2006.01); G06T 5/00 (2006.01); H04N 5/74 (2006.01);
U.S. Cl.
CPC ...
H04N 5/21 (2013.01); G06T 5/00 (2013.01); G06T 7/0018 (2013.01); H04N 5/211 (2013.01); H04N 5/74 (2013.01); H04N 9/3182 (2013.01); H04N 9/3185 (2013.01); H04N 9/3194 (2013.01); H04N 13/0007 (2013.01); H04N 13/0459 (2013.01);
Abstract
Certain aspects relate to a method and system whereby any defined system characteristic, property, or parameter can be normalized for farther improving the displayed image quality. The normalization processing can use a generalized calibration process and can normalize a system characteristic, or a system property, and/or parameter to result in a more uniform or accurately displayed image using a generalized image processing method.