The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2015
Filed:
Oct. 23, 2012
Kabushiki Kaisha Topcon, Itabashi-ku, Tokyo-to, JP;
Kaoru Kumagai, Tokyo-to, JP;
Jun-ichi Kodaira, Tokyo-to, JP;
Kabushiki Kaisha TOPCON, Tokyo-to, JP;
Abstract
An image measuring system comprises a projection optical system, having a light source for emitting and projecting an illumination light through a light projection optical axis. The system further comprises a photodetection optical system, having an image pickup element, which receives a retroreflection light from an object to be measured through a photodetection optical axis, and a control arithmetic device for processing the data taken by the image pickup element. The projection optical system comprises a light projection unit for directing the light projection optical axis toward the object to be measured and projecting the illumination light, a projection angle changing means for rotating the light projection unit in an elevating and a horizontal direction and for changing a projection angle of the illumination light, and a direction detecting means for detecting a direction angle of the light projection optical axis with respect to the photodetection optical axis.