The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2015
Filed:
Mar. 12, 2014
Tadashi Kitai, Kanagawa, JP;
Tadashi Kitai, Kanagawa, JP;
RICOH COMPANY, LIMITED, Tokyo, JP;
Abstract
An image inspection device includes: a read-image acquiring unit that acquires a read image of a formed and output image; an inspection-image generating unit that generates an inspection image used for inspection of the read image on the basis of information of an image to be formed and output acquired from an image processing apparatus that corrects density of the image according to a state of an image forming apparatus, and generates the information; and an inspection-result acquiring unit that acquires a result of determination of a defect in the read image based on a difference between the inspection image and the read image. The inspection-image generating unit acquires density correction information in which densities before and after density of the image is corrected are associated, and generates the inspection image corresponding to density before corrected, on the basis of the acquired density correction information.