The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2015

Filed:

Nov. 25, 2009
Applicants:

Wonjong Rhee, San Francisco, CA (US);

Ardavan Maleki Tehrani, Menlo Park, CA (US);

Mehdi Mohseni, Menlo Park, CA (US);

George Ginis, San Mateo, CA (US);

Haibo Zhang, Fremont, CA (US);

Sun-uk Park, Los Altos, CA (US);

Inventors:

Wonjong Rhee, San Francisco, CA (US);

Ardavan Maleki Tehrani, Menlo Park, CA (US);

Mehdi Mohseni, Menlo Park, CA (US);

George Ginis, San Mateo, CA (US);

Haibo Zhang, Fremont, CA (US);

Sun-Uk Park, Los Altos, CA (US);

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04M 3/30 (2006.01); H04L 12/28 (2006.01); H04L 12/24 (2006.01); H04L 12/26 (2006.01); H04B 3/46 (2015.01); H04B 3/32 (2006.01);
U.S. Cl.
CPC ...
H04M 3/304 (2013.01); H04B 3/46 (2013.01); H04L 12/2869 (2013.01); H04L 41/5035 (2013.01); H04L 43/0847 (2013.01); H04B 3/32 (2013.01); H04M 3/30 (2013.01);
Abstract

A method for detecting a defect in wiring in a DSL system. The method includes collecting data including instantaneous values, a history of values, and/or parameters relating to a central office or customer premises equipment, analyzing a line for a wiring defect based on the collected data, and reporting whether or not a wiring defect was detected responsive to the analyzing step.


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