The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2015

Filed:

Oct. 17, 2014
Applicant:

Marvell International Ltd., Hamilton, BM;

Inventors:

Yuji Meng, Shanghai, CN;

Yicheng Chen, Shanghai, CN;

Jin Zhang, Pleasanton, CA (US);

Kok-Wui Cheong, Los Altos, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 1/10 (2006.01); H04B 17/00 (2015.01);
U.S. Cl.
CPC ...
H04B 1/1036 (2013.01); H04B 17/0055 (2013.01); H04B 2001/1072 (2013.01);
Abstract

Aspects of the disclosure provide a method for detecting interference. The method includes receiving a plurality of frequency components of a signal received at a first device, identifying, among the plurality of frequency components, first frequency components that are not corrupted by interference, determining a noise power threshold based on the first frequency components, and comparing powers of the plurality of frequency components with the noise power threshold to determine second frequency components to be suppressed during decoding of the signal.


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