The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2015

Filed:

Sep. 13, 2011
Applicants:

Katsumi Suzuki, Tokyo, JP;

Takeyuki Suzuki, Tokyo, JP;

Inventors:

Katsumi Suzuki, Tokyo, JP;

Takeyuki Suzuki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 1/067 (2006.01); H01R 13/24 (2006.01); H01R 11/18 (2006.01); G01R 1/04 (2006.01);
U.S. Cl.
CPC ...
H01R 11/18 (2013.01); G01R 1/0483 (2013.01); G01R 1/06722 (2013.01); G01R 1/06738 (2013.01); H01R 13/2421 (2013.01); H01R 13/2485 (2013.01);
Abstract

A contact probe having a plunger; a top contacting member which is provided at a tip end of the plunger and is brought into contact with an electrode of a semiconductor device; a bottom contacting member which is brought into contact with an electrode of a testing board; and an elastic member for urging the top contacting member and the bottom contacting member in opposite directions away from each other. The plunger is formed into a cylindrical shape and includes a through-hole which penetrates through the plunger in an axial direction thereof. The top contacting member includes a plurality of mountain-shaped sharp portions at a tip end thereof, and each of the sharp portions is asymmetrical with respect to a straight line that passes through a peak of the sharp portion and extends along an axial direction of the plunger, and is bent toward a center line of the plunger.


Find Patent Forward Citations

Loading…