The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2015

Filed:

Jun. 28, 2012
Applicants:

Kei Shinotsuka, Kawasaki, JP;

Takayuki Okamoto, Niiza, JP;

Etsuko Kawamukai, Narashino, JP;

Norio Yamamura, Yokohama, JP;

Inventors:

Kei Shinotsuka, Kawasaki, JP;

Takayuki Okamoto, Niiza, JP;

Etsuko Kawamukai, Narashino, JP;

Norio Yamamura, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 51/56 (2006.01); H01L 51/52 (2006.01); H05B 33/02 (2006.01); H05B 33/10 (2006.01); H01L 51/00 (2006.01); H01L 51/50 (2006.01);
U.S. Cl.
CPC ...
H01L 51/56 (2013.01); H01L 51/0017 (2013.01); H01L 51/5036 (2013.01); H01L 51/52 (2013.01); H01L 51/5268 (2013.01); H01L 51/5275 (2013.01); H05B 33/02 (2013.01); H05B 33/10 (2013.01); H01L 51/5203 (2013.01); Y10T 428/24479 (2015.01);
Abstract

A method of manufacturing an organic light-emitting diode including preparing, by a dry etching method using a particle single layer film as an etching mask, a substrate provided with an uneven structure in which a plurality of unevenness is arranged in two dimensions on the surface of the substrate, and stacking, on the uneven structure, at least an anode conductive layer, an EL layer including a light-emitting layer containing an organic light-emitting material, and a cathode conductive layer containing a metal layer, such that the uneven structure is reproduced on the surface of the metal layer on the side of the EL layer, wherein the particle single layer film is formed using a mixture of a plurality of particles having different particle sizes, and an uneven structure is provided which satisfies particular requirements.


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