The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2015

Filed:

Jun. 20, 2013
Applicant:

Fujitsu Semiconductor Limited, Yokohama-shi, JP;

Inventor:

Satoshi Otsuka, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01L 21/78 (2006.01); H01L 21/768 (2006.01); H01L 23/522 (2006.01); H01L 23/58 (2006.01); H01L 23/00 (2006.01);
U.S. Cl.
CPC ...
H01L 21/78 (2013.01); H01L 21/76801 (2013.01); H01L 21/76808 (2013.01); H01L 21/76819 (2013.01); H01L 21/76838 (2013.01); H01L 23/522 (2013.01); H01L 23/585 (2013.01); H01L 24/03 (2013.01); H01L 24/05 (2013.01); H01L 2224/02166 (2013.01); H01L 2224/0401 (2013.01); H01L 2224/04042 (2013.01); H01L 2224/05093 (2013.01); H01L 2224/05554 (2013.01); H01L 2224/05567 (2013.01); H01L 2224/05624 (2013.01); H01L 2924/0002 (2013.01); H01L 2924/00014 (2013.01); H01L 2924/01002 (2013.01); H01L 2924/01005 (2013.01); H01L 2924/0105 (2013.01); H01L 2924/01006 (2013.01); H01L 2924/01013 (2013.01); H01L 2924/01014 (2013.01); H01L 2924/01015 (2013.01); H01L 2924/01018 (2013.01); H01L 2924/01019 (2013.01); H01L 2924/01021 (2013.01); H01L 2924/01022 (2013.01); H01L 2924/01029 (2013.01); H01L 2924/01033 (2013.01); H01L 2924/01038 (2013.01); H01L 2924/01059 (2013.01); H01L 2924/01073 (2013.01); H01L 2924/01074 (2013.01); H01L 2924/01078 (2013.01); H01L 2924/01082 (2013.01); H01L 2924/05042 (2013.01); H01L 2924/13091 (2013.01); H01L 2924/14 (2013.01); H01L 2924/19043 (2013.01); H01L 2924/3025 (2013.01); H01L 2924/30105 (2013.01);
Abstract

A semiconductor device fabrication method includes preparing a semiconductor wafer having a plurality of chip areas formed with semiconductor elements and a scribe area having a dicing area in said scribe area for separating said plurality of chip areas, wherein in said scribe area a groove forming area is defined to surround each chip area at a position outside of the dicing area, disposing a multilayer wiring structure including dummy wirings above said semiconductor wafer, said multilayer wiring structure having interlayer insulating films and wiring layers alternately formed, forming a cover layer including a passivation layer, said cover layer covering said multilayer wiring structure, and forming a groove in each said groove forming area, said groove surrounding each of said plurality of chip areas and extending from a surface of said semiconductor wafer and at least through said passivation layer.


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