The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2015

Filed:

May. 07, 2012
Applicants:

Hyung-suk Choi, Cheongju-si, KR;

Hyun-tae Jung, Cheongju-si, KR;

Eung-ryul Park, Cheongju-si, KR;

Da-soon Lee, Cheongju-si, KR;

Inventors:

Hyung-suk Choi, Cheongju-si, KR;

Hyun-tae Jung, Cheongju-si, KR;

Eung-ryul Park, Cheongju-si, KR;

Da-soon Lee, Cheongju-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/06 (2006.01); H01L 21/762 (2006.01); H01L 21/761 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76224 (2013.01); H01L 21/761 (2013.01);
Abstract

An isolation structure of a semiconductor, a semiconductor device having the same, and a method for fabricating the isolation structure are provided. An isolation structure of a semiconductor device may include a trench formed in a substrate, an oxide layer formed on a bottom surface and an inner sidewall of the trench, a filler formed on the oxide layer to fill a part of inside of the trench, and a fourth oxide layer filling an upper portion of the filler of the trench to a height above an upper surface of the trench, an undercut structure being formed on a boundary area between the inner sidewall and the oxide layer.


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