The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2015
Filed:
Feb. 23, 2011
Hamid R. Badiei, Woodbridge, CA;
Dmitry Bandura, Aurora, CA;
Vladimir Baranov, Richmond Hill, CA;
Kaveh Kahen, Maple, CA;
Scott Tanner, Aurora, CA;
Hamid R. Badiei, Woodbridge, CA;
Dmitry Bandura, Aurora, CA;
Vladimir Baranov, Richmond Hill, CA;
Kaveh Kahen, Maple, CA;
Scott Tanner, Aurora, CA;
PerkinElmer Health Sciences, Inc., Waltham, MA (US);
Abstract
A mass analysis system including a sample inlet arranged to introduce a sample and an ion source coupled to the sample inlet and arranged to ionize a portion of the sample into ions. The system also includes a sampler element having a sample orifice arranged to receive the sample ions into a first vacuum chamber. The system includes a skimmer element having a skimmer orifice arranged to receive the sample ions from the first vacuum chamber into a second vacuum chamber where the skimmer orifice is of a first size. The system further includes a third cone element having a third cone orifice of a second size arranged to receive the sample ions from the second vacuum chamber into a third vacuum chamber where the third cone is configured to allow a continuum flow of ions through the third cone orifice. The third chamber includes an ion optics assembly and mass analyzer.