The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2015
Filed:
Jan. 26, 2011
Gongyu Jiang, Shanghai, CN;
Hui Mu, Shanghai, CN;
LI Ding, Manchester, GB;
SHIMADZU RESEARCH LABORATORY (SHANGHAI) CO. LTD., Shanghai, CN;
Abstract
A tandem mass spectrometer is provided in the present invention. The mass spectrometer includes an ion source, a quadrupole mass filter located at downstream side of the ion source, a linear ion trap disposed at downstream side of the mass filter and an ion detector placed on the side of the ion trap, all of which are placed in a vacuum environment. The instrument can obtain MS meeting the standard spectral library search criteria by the quadrupole mass filter cooperating with linear ion trap, realize any multi-stage MS under two modes of axial collision and resonance excitation, and predict and optimize the inflow amount and types of samples under the ion trap analysis mode by the quadrupole. A tandem MS analysis method is also provided, which can repeatedly provide precursor ion selection, ion acceleration, achieve high-energy collision dissociation, low product ion mass discrimination effect.