The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2015

Filed:

Dec. 03, 2012
Applicant:

Carl Zeiss Meditec, Inc., Dublin, CA (US);

Inventor:

Paul F. Stetson, Piedmont, CA (US);

Assignee:

Carl Zeiss Meditec, Inc., Dublin, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G06T 11/00 (2006.01); G06T 15/08 (2011.01); A61B 3/14 (2006.01); A61B 3/10 (2006.01);
U.S. Cl.
CPC ...
G06T 11/003 (2013.01); A61B 3/102 (2013.01); A61B 3/14 (2013.01); G06T 15/08 (2013.01);
Abstract

The present invention improves projection displays of volume data. Using the Minimum Intensity Projection (MinIP), fluid filled regions or other regions of hyporeflective tissue are displayed. By limiting the projection to partial volumes within the volume, differences in the scattering intensity within specific regions are isolated. In this way, hyperreflectivity of weakly scattering tissue can be assessed.


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