The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2015

Filed:

Nov. 29, 2010
Applicants:

Ana-maria Popescu, Mountain View, CA (US);

Marco Pennacchiotti, Mountain View, CA (US);

Inventors:

Ana-Maria Popescu, Mountain View, CA (US);

Marco Pennacchiotti, Mountain View, CA (US);

Assignee:

Yahoo! Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01); G06Q 10/10 (2012.01); G06Q 50/00 (2012.01);
U.S. Cl.
CPC ...
G06Q 10/10 (2013.01); G06Q 50/01 (2013.01);
Abstract

A method, device, and computer-readable storage medium storing instructions are provided for detecting controversial events that are reflected in user-generated content items. In a single-step approach, user-generated content items are received and analyzed by a controversial event detection module, which determines the likelihood that sets of content items reflect controversial events. In one example, public posts by users of a social networking service are grouped into snapshots of posts that are associated with an entity and were generated during a window of time. An event detection module may determine the likelihood that snapshots reflect events. In a two-step approach, event snapshots are provided to a controversy detection module, which determines the likelihood that event snapshots are controversial. In a blended approach, snapshots are provided to a controversy detection module, which determines the likelihood that snapshots are controversial events based in part on the event score.


Find Patent Forward Citations

Loading…