The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2015

Filed:

Jun. 20, 2011
Applicants:

Leon Bottou, Kirkland, WA (US);

Kumar Chellapilla, Sammamish, WA (US);

Patrice Y. Simard, Bellevue, WA (US);

David Max Chickering, Bellevue, WA (US);

Inventors:

Leon Bottou, Kirkland, WA (US);

Kumar Chellapilla, Sammamish, WA (US);

Patrice Y. Simard, Bellevue, WA (US);

David Max Chickering, Bellevue, WA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 30/00 (2012.01); G06N 7/00 (2006.01); G06Q 30/02 (2012.01);
U.S. Cl.
CPC ...
G06N 7/005 (2013.01); G06Q 30/0242 (2013.01);
Abstract

Methods, systems, and computer-storage media having computer-usable instructions embodied thereon for calculating event probabilities are provided. The event may be a click probability. Event probabilities are calculated using a system optimized for runtime model accuracy with an operable learning algorithm. Bin counting techniques are used to calculate event probabilities based on a count of event occurrences and non-event occurrences. Linear parameters, such and counts of clicks and non-clicks, may also be used in the system to allow for runtime adjustments.


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