The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2015

Filed:

Dec. 28, 2010
Applicants:

Michinori Shioda, Yokohama, JP;

Toshihiko Ouchi, Machida, JP;

Inventors:

Michinori Shioda, Yokohama, JP;

Toshihiko Ouchi, Machida, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/00 (2006.01); G06K 9/00 (2006.01); G01N 21/3581 (2014.01);
U.S. Cl.
CPC ...
G06K 9/00516 (2013.01); G01N 21/3581 (2013.01);
Abstract

The present invention provides an apparatus and a method for transforming a time waveform of an electromagnetic wave into a time waveform suited for signal processing and the like so as to measure the time waveform. A wavelet transform is performed on a first time waveform of an electromagnetic wave, such as a terahertz wave, measured in advance, and a second time waveform suited for signal processing and having a high correlation with a mother wavelet used in the wavelet transform is formed by controlling a wavelet expansion coefficient. In a second measurement process and onward of a target object, a transforming unit, such as a bias voltage controller, is used to transform the electromagnetic wave into a transformed time waveform so as to measure the time waveform.


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