The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2015
Filed:
Jan. 22, 2014
International Business Machines Corporation, Armonk, NY (US);
John E. Barwin, III, Essex Junction, VT (US);
Jason Chung, Williston, VT (US);
Amol A. Joshi, Essex Junction, VT (US);
William J. Livingstone, Underhill, VT (US);
Leon J. Sigal, Monsey, NY (US);
Brian Worth, Jericho, VT (US);
Paul S. Zuchowski, Jericho, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method of characterizing an electromigration (EM) parameter for use in an integrated circuit (IC) chip design including, inputting a layout of a wire layer and identifying a signal gate-circuit including electrically parallel paths, connected to an output of the signal gate from the layout. Based on widths for each of the paths, determining a maximum possible current for each of the paths, and calculating an average current for each of the paths. Identifying a path that is most limited in its current carrying capacity by possible EM failure mechanisms, and storing in a design library, a possible maximum current output to the identified limiting path, as the EM parameter.