The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2015

Filed:

Oct. 15, 2014
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Jane C. Fung, Thornhill, CA;

Perry R. Giffen, Kemptville, CA;

Paul J. Gooderham, Markham, CA;

Malik S. Hemani, Mississauga, CA;

Karice L. McIntyre, Nepean, CA;

William G. O'Farrell, Markham, CA;

Shu X. Tan, Toronto, CA;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3664 (2013.01); G06F 8/34 (2013.01); G06F 11/362 (2013.01);
Abstract

SMAPs are generated for use in debugging visual paradigms. A system can debug a non-Java source, or a visual paradigm, embedded inside another distinct paradigm. The system may include a visual object ordering system that determines an order number for each of a plurality of visual objects in the visual paradigm, and a mapping system that maps the order number of each visual object to a set of line numbers in the associated code output.


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