The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2015

Filed:

Mar. 15, 2013
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

John P. Karidis, Ossining, NY (US);

Luis A. Lastras, Cortlandt Manor, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0751 (2013.01);
Abstract

A method for detecting memory cells that are stuck in a physical state. The method includes performing a diagnostic read of a memory cell in a memory system. The memory system is configured to utilize at least one read threshold value to determine a read data value stored in the memory cell when performing a data read operation on the memory cell. Performing the diagnostic read includes: comparing a measurement property of the memory cell to at least one diagnostic threshold value, where at least one of the diagnostic threshold values is different from all of the read threshold values; and identifying the memory cell as being stuck in a physical state based on the comparing. Based on identifying the memory cell as being stuck in a physical state, an indication that memory cell is stuck is output along with a diagnostic data value associated with the physical state.


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