The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2015
Filed:
Apr. 12, 2011
Norbert Brill, Gerlikon, CH;
Norbert Brill, Gerlikon, CH;
MMI AG, Glattbrugg, CH;
Abstract
A method for the collision-free positioning of a micromanipulation tool relative to a sample carrier with the aid of a microscope, comprising the following steps: a) determining the focal position Zof at least one point P on the surface of the sample carrier by focusing a microscope objective with a first numerical aperture NAon the at least one point; b) positioning the micromanipulation tool on the optical axis of the microscope; c) determining the focal position Zof the micromanipulation tool by focusing the microscope objective or a second microscope objective with a second numerical aperture NAsmaller than the first numerical aperture NAonto the tip of the micromanipulation tool; d) calculating the lowering distance Z(P) taking into account a predetermined tolerance profile ΔZ by the following equation: Z(P)=Z−Z−ΔZ where ΔZ=ΔZ+ΔZ, wherein ΔZand/or ΔZis a predetermined tolerance in the determination of the position of the manipulation tool and sample carrier, respectively; and e) positioning the micromanipulation tool at the point P by lowering by the lowering distance Z(P).
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