The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2015

Filed:

Apr. 24, 2014
Applicant:

Orthogonal, Inc., Rochester, NY (US);

Inventors:

Charles Warren Wright, Fairport, NY (US);

Diane Carol Freeman, Pittsford, NY (US);

Frank Xavier Byrne, Webster, NY (US);

John Andrew DeFranco, Rochester, NY (US);

Sandra Rubsam, Webster, NY (US);

Terrence Robert O'Toole, Webster, NY (US);

Douglas Robert Robello, Webster, NY (US);

Assignee:

Orthogonal, Inc., Rochester, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/26 (2006.01); G03F 7/038 (2006.01); G03F 7/40 (2006.01); G03F 7/20 (2006.01); G03F 7/42 (2006.01);
U.S. Cl.
CPC ...
G03F 7/038 (2013.01); G03F 7/20 (2013.01); G03F 7/40 (2013.01); G03F 7/422 (2013.01);
Abstract

A fluorinated photopolymer is formed on a device substrate and exposed to patterned radiation. The photopolymer has a total fluorine content in a weight range of 15 to 60% and comprises at least three distinct repeating units, including a first repeating unit having a fluorine-containing group, a second repeating unit having an acid- or alcohol-forming precursor group, and a third repeating unit different from the first and second repeating units. The pattern-exposed photopolymer layer is contacted with a developing solution comprising at least a first fluorinated solvent that dissolves the unexposed photopolymer thereby forming a developed structure having a first pattern of photopolymer covering the substrate and a complementary second pattern of uncovered substrate. The developing solution is selected to provide a maximum photopolymer contrast in a range of 1.9 to 5.0.


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