The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2015
Filed:
Feb. 04, 2013
King Fahd University of Petroleum and Minerals, Dhahran, SA;
Wail Mousa, Dhahran, SA;
Abdullatif Abdulrahman Al-Shuhail, Dhahran, SA;
KING FAHD UNIVERSITY OF PETROLEUM AND MINERALS, Dhahran, SA;
Abstract
The method of first arrival picking of seismic refraction data is embodied in software that uses the τ-p transform on energy-ratio seismic records. First, the seismic shots are gathered. Next, the energy ratio (ER) is computed, and then the τ-p transform of the energy ratio is computed. Using a binary mask, a corresponding first arrival energy is selected. The transform is combined with the binary mask and presented as input to an inverse τ-p transform. The inverse transform data is then thresholded, and indices of ER first arrivals are detected based on the thresholds. The software then creates a vector of indices or time samples of picks. This method can be used to better guide the subsequent careful picking of first arrivals. Moreover, the method automatically interpolates missing picks.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile