The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2015

Filed:

Sep. 30, 2011
Applicants:

Niklas Törnkvist, Kauniainen, FI;

Pekka Hänninen, Turku, FI;

Inventors:

Niklas Törnkvist, Kauniainen, FI;

Pekka Hänninen, Turku, FI;

Assignee:

Aqsens Oy, Espoo, FI;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 8/20 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G01V 8/20 (2013.01); G01N 21/6408 (2013.01); G01N 21/6452 (2013.01); G01N 21/6454 (2013.01); G01N 2201/0626 (2013.01); G01N 2201/129 (2013.01);
Abstract

An apparatus and method are disclosed for examining optically a sample carried in a plurality of wells. A holder is adapted to receive and hold in place a sample carrier. A plurality of excitation means selectively introduce excitation towards a spatially limited portion of a sample carrier held in place by said holder. Detecting means receive and detect emission radiation coupled out from a light output window of a sample carrier held in place by said holder. Said detecting means is common to said excitation means and is configured to receive emission radiation from a plurality of different spatially limited portions of a sample carrier held in place by said holder.


Find Patent Forward Citations

Törnkvist, Niklas. (2015). Method, apparatus, and system for examining optically a sample carried in a plurality of wells (U.S. Patent No. 9103932). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9103932

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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