The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2015
Filed:
Jul. 23, 2010
Masatoshi Watanabe, Isehara, JP;
Taihei Mukaide, Atsugi, JP;
Kazuhiro Takada, Kawasaki, JP;
Kazunori Fukuda, Fujisawa, JP;
Masatoshi Watanabe, Isehara, JP;
Taihei Mukaide, Atsugi, JP;
Kazuhiro Takada, Kawasaki, JP;
Kazunori Fukuda, Fujisawa, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
An X-ray imaging apparatus and an X-ray imaging method for use in the X-ray imaging apparatus are provided. The X-ray imaging apparatus includes a separating element configured to spatially separate an X-ray generated by an X-ray generator unit and a scintillator array including a plurality of first scintillators arranged therein, where the separated X-rays are made incident on the first scintillators. Each of the first scintillators is configured to vary an intensity of fluorescence induced by the X-ray in accordance with an incident position of the X-ray. The X-ray imaging apparatus further includes a detector configured to detect the intensity of fluorescence emitted from the scintillator array.