The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2015
Filed:
Nov. 02, 2012
National Central University, Jhongli, Taoyuan County, TW;
Te-Yuan Chung, Pingtung County, TW;
NATIONAL CENTRAL UNIVERSITY, Jhongli, Taoyuan County, TW;
Abstract
A highly adaptive thermal properties measurement system and measuring method thereof, for measuring various thermal property values of a device under test without actually lighting up the device under test, are disclosed. The measurement system includes a light source unit, a light modulation module, a holding unit, a thermal reflection unit, a thermal signal capture unit, and a control and computation unit. A light field provided from the light source unit is first modulated by the light modulation module for its distribution of intensity, and then illuminates on the device under test such that the device under test is heated in a specific mode so as to simulate a temperature distribution of the device under test in a state of continuous operation. Further, the control and computation unit computes various thermal property values of the device under test based on a top-surface thermal signal and a bottom-surface thermal signal captured by the thermal signal capture unit.