The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2015

Filed:

Jul. 24, 2006
Applicants:

Kate Bechtel, Somerville, MA (US);

Wei-chuan Shih, Cambridge, MA (US);

Michael S. Feld, Newton, MA (US);

Inventors:

Kate Bechtel, Somerville, MA (US);

Wei-Chuan Shih, Cambridge, MA (US);

Michael S. Feld, Newton, MA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/1455 (2006.01); G01N 21/65 (2006.01); A61B 5/145 (2006.01);
U.S. Cl.
CPC ...
G01N 21/65 (2013.01); A61B 5/1455 (2013.01); A61B 5/14532 (2013.01); A61B 5/14546 (2013.01); A61B 2560/0223 (2013.01);
Abstract

The present invention relates to systems and methods for the measurement of analytes such as glucose. Raman and reflectance spectroscopy are used to measure a volume, of material such as a blood sample or tissue within a subject and determine a concentration of a blood analyte based thereon. The present invention further relates to a calibration method, constrained regularization (CR), and demonstrates its use for analyzing spectra including, for example, the measurement glucose concentrations using transcutaneous Raman spectroscopy.


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