The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2015

Filed:

May. 19, 2011
Applicants:

Lucio Renna, Catania, IT;

Clelia Galati, San Gregorio di Catania, IT;

Natalia Maria Rita Spinella, Paternè, IT;

Salvatore Coffa, Tremestieri Etneo, IT;

Inventors:

Lucio Renna, Catania, IT;

Clelia Galati, San Gregorio di Catania, IT;

Natalia Maria Rita Spinella, Paternè, IT;

Salvatore Coffa, Tremestieri Etneo, IT;

Assignee:

STMicroelectronics S.r.l., Agrate Brianza, IT;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 21/64 (2006.01); B01L 3/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6458 (2013.01); B01L 3/502707 (2013.01); B01L 3/502715 (2013.01); G01N 21/6408 (2013.01); B01L 2300/0636 (2013.01); B01L 2300/0877 (2013.01); B01L 2300/0887 (2013.01); G01N 2021/6432 (2013.01); G01N 2021/6482 (2013.01);
Abstract

A microfluidic diagnostic device () comprising a substrate (); a compatible layer () formed on a first face () of the substrate (); a structural layer (), formed on top of the compatible layer (); a channel (), formed in the structural layer () and limited underneath by the compatible layer (), optically accessible by a first luminous radiation having a first wavelength (λ); and a cover layer () made of a material transparent to the first wavelength (λ), arranged on top of the structural layer () and sealing the channel () at the top, wherein the compatible layer () has a thickness equal to approximately a quarter of the first wavelength (λ) divided by the refraction index of the compatible layer (), or equal to an odd multiple of a quarter of the first wavelength (λ) divided by the refraction index of the compatible layer ().


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