The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2015

Filed:

Nov. 15, 2013
Applicant:

Iowa State University Research Foundation, Inc., Ames, IA (US);

Inventors:

Sanjeevi Sivasankar, Ames, IA (US);

Hui Li, SuZhou, CN;

Chi-Fu Yen, Ames, IA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 1/58 (2006.01); G01N 21/64 (2006.01); G01B 11/14 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6404 (2013.01); G01B 11/14 (2013.01);
Abstract

We describe a new technique, standing wave axial nanometry (SWAN), to image the axial location of a single nanoscale fluorescent object with sub-nanometer accuracy and 3.7 nm precision. A standing wave, generated by positing an atomic force microscope tip over a focused laser beam, is used to excite fluorescence; axial position is determined from the phase of the mission intensity.


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