The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2015
Filed:
Mar. 15, 2013
National Applied Research Laboratories, Taipei, TW;
Tai-Shan Liao, Hsinchu, TW;
Chi-Hung Huang, Hsinchu, TW;
Chih-Chieh Wu, HsinChu, TW;
Din Ping Tsai, Hsinchu, TW;
Shih-Jie Chou, Hsinchu, TW;
Cheng-Fang Ho, Hsinchu, TW;
National Applied Research Laboratories, Taipei, TW;
Abstract
An image-based refractive index measuring system comprises an optical device and an electronic device. The optical device is used to guiding an external light which is passed through an analyte. The electronic device comprises an image capture module, an image analyze module and a display module. The image capture module generates a first image by capturing the external light source. The image analyze module connects to the image capture module to receive the first image, and analyzes the first image in order to generate an analytical result comprising the refractive index of the analyte. The display module connects to the image analyze module to receive and display the analytical result.