The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2015

Filed:

Oct. 25, 2010
Applicants:

Bernd Sartorius, Berlin, DE;

Helmut Roehle, Berlin, DE;

Dennis Stanze, Berlin, DE;

Inventors:

Bernd Sartorius, Berlin, DE;

Helmut Roehle, Berlin, DE;

Dennis Stanze, Berlin, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/02 (2006.01); G01N 21/3581 (2014.01); G01N 21/90 (2006.01); G01N 21/3563 (2014.01);
U.S. Cl.
CPC ...
G01N 21/3581 (2013.01); G01N 21/3563 (2013.01); G01N 21/90 (2013.01);
Abstract

A material may be identified using THz radiation that simultaneously or sequentially includes at least one first frequency portion and a second frequency portion different therefrom. An object formed from the material to be identified is irradiated with the THz radiation and the THz radiation exiting the object is detected using a phase-sensitive THz receiver. A time or phase offset, caused by the object, is measured at least for the first frequency portion and a material thickness is determined therefrom. Attenuation of the received signal, at least for the second frequency portion, is determined. An absorption coefficient for at least the second frequency portion is calculated using the material thickness.


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