The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2015

Filed:

Dec. 03, 2010
Applicants:

Jianfeng Chen, Pearland, TX (US);

Xudong Yang, Katy, TX (US);

Inventors:

Jianfeng Chen, Pearland, TX (US);

Xudong Yang, Katy, TX (US);

Assignee:

Baker Hughes Incorporated, Houston, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 5/00 (2006.01); E21B 41/00 (2006.01); G01L 1/24 (2006.01);
U.S. Cl.
CPC ...
G01L 1/246 (2013.01);
Abstract

A method, apparatus and computer-readable medium for determining deformation of a plurality of coupled members. A distributed strain sensor string on a first member is coupled to a distributed strain sensor string on a second member. Signals are obtained from the sensor strings. A subset of strain data relating to sensor strain on the first member and the second member is created. A virtual sensor string is created having a plurality of virtual sensors placed on the first and second members including a joint therebetween. Strain data of sensors in the distributed stain sensor strings is mapped to sensors in the virtual sensor string. The deformation of the plurality of coupled members is determined using the strain data of the virtual sensors.


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