The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2015
Filed:
Mar. 05, 2012
Joseph Kostrzewa, Buellton, CA (US);
Leonard Araki, Goleta, CA (US);
Russell D. Grannemann, Goleta, CA (US);
Joseph Kostrzewa, Buellton, CA (US);
Leonard Araki, Goleta, CA (US);
Russell D. Grannemann, Goleta, CA (US);
FLIR Systems, Inc., Wilsonville, OR (US);
Abstract
Various techniques are disclosed to detect and mitigate the effects of burn-in events occurring in thermal imaging systems. Such events may be attributable to the sun (e.g., solar burn-in) and/or other high thermal energy sources. In one example, a method includes detecting a burn-in event that causes thermal images captured by a focal plane array (FPA) to exhibit a blemish; and mitigating the blemish in the thermal images. In another example, a thermal imaging system includes a focal plane array (FPA) adapted to capture thermal images; and a processor adapted to: detect a burn-in event that causes the thermal images to exhibit a blemish, and mitigate the blemish in the thermal images.