The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2015

Filed:

Feb. 23, 2012
Applicants:

Yash Vasavada, Gaithersburg, MD (US);

Xiaoling Huang, Boyds, MD (US);

Ambarish Purohit, Boyds, MD (US);

Channasandra Ravishankar, Clarksburg, MD (US);

John E. Corrigan, Iii, Chevy Chase, MD (US);

Inventors:

Yash Vasavada, Gaithersburg, MD (US);

Xiaoling Huang, Boyds, MD (US);

Ambarish Purohit, Boyds, MD (US);

Channasandra Ravishankar, Clarksburg, MD (US);

John E. Corrigan, III, Chevy Chase, MD (US);

Assignee:

Hughes Network Systems LLC, Germantown, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 1/00 (2006.01); H04B 15/00 (2006.01); H01Q 3/26 (2006.01);
U.S. Cl.
CPC ...
H01Q 3/267 (2013.01);
Abstract

A method for iterative estimation of a set of unknown channel parameters in a beamforming network including determining a first order estimate of offsets at measurement nodes and an estimate of the confidence in the initial estimate of the measurement nodes' offsets, and iterating, until a desired estimation accuracy is obtained, determining an improved estimate of a parameter set, and the confidence in the estimates, using the prior estimate of the offsets at the measurement nodes and determining an improved estimate of the offsets at the measurement nodes and the associated confidence values using the prior estimate of the parameter set and the corresponding confidence values.


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