The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2015

Filed:

Mar. 05, 2013
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventors:

Tsutomu Kakuno, Kanagawa-ken, JP;

Ryuichi Togawa, Tokyo, JP;

Hiroshi Ito, Kanagawa-ken, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/20 (2006.01); H01L 21/263 (2006.01); B23K 26/00 (2014.01); B23K 26/073 (2006.01); B23K 26/08 (2014.01); C30B 1/02 (2006.01); C30B 28/08 (2006.01); C30B 29/06 (2006.01); C30B 35/00 (2006.01); H01L 21/268 (2006.01);
U.S. Cl.
CPC ...
H01L 21/2636 (2013.01); B23K 26/0066 (2013.01); B23K 26/0738 (2013.01); B23K 26/083 (2013.01); C30B 1/02 (2013.01); C30B 1/023 (2013.01); C30B 28/08 (2013.01); C30B 29/06 (2013.01); C30B 35/00 (2013.01); H01L 21/268 (2013.01);
Abstract

According to one embodiment, a laser annealing method includes: detecting an intensity distribution of a laser light formed as a line beam by a line beam optical system; dividing width in short axis direction of the line beam in the detected intensity distribution by number of times of the irradiation per one site and partitioning the width; and calculating increment of crystal grain size of a non-crystalline thin film for energy density corresponding to wave height of the partitioned intensity distribution, and summing the increments by number of times of pulse irradiation, when energy density of the laser light is larger than a threshold, the crystal grain size of the non-crystalline thin film taking a downward turn at the threshold, the increment summed before the energy density exceeds the threshold being set to zero.


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