The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2015

Filed:

Jun. 16, 2014
Applicant:

Semiconductor Manufacturing International (Shanghai) Corporation, Shanghai, CN;

Inventor:

Qiuhua Han, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/8238 (2006.01); H01L 27/092 (2006.01);
U.S. Cl.
CPC ...
H01L 27/092 (2013.01); H01L 21/823828 (2013.01);
Abstract

A semiconductor device and method of forming the same includes a substrate having a NMOS region and a PMOS region. The method includes forming a dummy gate structure having a stacked sacrificial dielectric layer and a sacrificial gate material layer on the NMOS and PMOS regions. The method further includes concurrently removing the stacked sacrificial dielectric layer and a sacrificial gate material layer to form a groove, and forming a high-K dielectric layer and a first metal gate layer in the grove. The method also includes forming a hard mask over the NMOS region, removing the first metal gate layer and the high-K dielectric layer in the PMOS region to form a channel groove, forming a second high-K dielectric layer and a second metal gate layer in the channel grove, and removing the hard mask. The work function metal layer in the NMOS and PMOS regions can be independently controlled.


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