The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2015
Filed:
Dec. 14, 2011
Kwon-hae Yea, Seoul, KR;
Hyungki Cha, Daejeon, KR;
Sung-man Lee, Daegu, KR;
Sang-soon Park, Chungcheongbuk-do, KR;
Seong Hee Park, Daejeon, KR;
Kwon-Hae Yea, Seoul, KR;
HyungKi Cha, Daejeon, KR;
Sung-Man Lee, Daegu, KR;
Sang-Soon Park, Chungcheongbuk-do, KR;
Seong Hee Park, Daejeon, KR;
Korea Atomic Energy Research Institute, Daejeon, KR;
Abstract
Disclosed herein is a prompt gamma-ray detection apparatus for analyzing chemical materials using femtosecond pulse laser-induced neutrons, which can be effectively used in the nondestructive inspection of various materials, such as metals, coal, cement, radioactive materials and the like as well as explosives and chemical materials, and which can provide better measurement results for the analysis of basic materials, and a method of measuring prompt gamma-rays using the apparatus. The prompt gamma-ray detection apparatus is advantageous because it can non-destructively analyze the elements in a chemical sample using a femtosecond pulse laser-induced neutron generator that solves the problems of an atomic reactor for research or a radioactive isotope as a neutron radiation source.