The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2015

Filed:

Sep. 10, 2012
Applicants:

Chang-kyu Seol, Osan-Si, KR;

Jun-jin Kong, Yongin-Si, KR;

Inventors:

Chang-Kyu Seol, Osan-Si, KR;

Jun-Jin Kong, Yongin-Si, KR;

Assignee:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 16/12 (2006.01); G06F 11/10 (2006.01); G11C 16/26 (2006.01); G11C 16/34 (2006.01);
U.S. Cl.
CPC ...
G11C 16/12 (2013.01); G06F 11/10 (2013.01); G11C 16/26 (2013.01); G11C 16/3422 (2013.01); G11C 16/3427 (2013.01);
Abstract

Data is read from memory cells, including at least one victim cell and at least one aggressor cell, using an element graph. Reading the data includes defining function nodes corresponding to probability density functions with respect to a first physical characteristic of the at least one victim cell and a second physical characteristic of the at least one aggressor cell, defining variable nodes corresponding to at least one first data value stored in the at least one victim cell and at least one second data value stored in the at least one aggressor cell, and defining edges connecting the function nodes and the variable nodes.


Find Patent Forward Citations

Loading…