The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2015
Filed:
May. 01, 2009
Jiaping Wang, Beijing, CN;
Shuang Zhao, Beijing, CN;
Xin Tong, Beijing, CN;
John M. Snyder, Redmond, WA (US);
Baining Guo, Redmond, WA (US);
Jiaping Wang, Beijing, CN;
Shuang Zhao, Beijing, CN;
Xin Tong, Beijing, CN;
John M. Snyder, Redmond, WA (US);
Baining Guo, Redmond, WA (US);
MICROSOFT TECHNOLOGY LICENSING, LLC, Redmond, WA (US);
Abstract
Described is a search technology in which spatially varying anisotropic reflectance is modeled using image data captured from a single view. Reflectance at each point is represented using a microfacet-based Bidirectional Reflectance Distribution Function (BRDF). Modeling processes the image data, which provides a partial normal distribution function (NDF) for each surface point. The NDF at each selected point is completed by texture synthesis using similar, overlapping partial NDFs from other points. Also described is a scanning device that illuminates a sample surface from a two-dimensional set of light directions using a linear array of LEDs moved over a flat sample.