The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2015

Filed:

Oct. 16, 2013
Applicant:

Gates Corporation, Denver, CO (US);

Inventors:

Flloyd M. Sobczak, Erie, CO (US);

James H. Sealey, Golden, CO (US);

Douglas R. Sedlacek, Centennial, CO (US);

Mark E. Stuemky, Westminster, CO (US);

Justin Aschenbrenner, Fenton, MO (US);

James Christian Bourque, Wheat Ridge, CO (US);

Assignee:

Gates Corporation, Denver, CO (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 5/00 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06T 5/009 (2013.01); G06T 7/0004 (2013.01); G06T 7/0085 (2013.01); G06T 2207/30164 (2013.01);
Abstract

Systems and methods are provided for the improvement of an image of a device under test, such as a belt. The image of device under test is made more optimal by determining if the object is rotated away from a preferred axis of the image frame. If so, the image is rotated an opposing angle such that the object is parallel to the preferred axis of the image frame. The rotated image is then made available for analysis of the object. Rib width analysis is performed along the entire length of the detected rib by either de-rotating the image or not.


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