The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2015
Filed:
Jul. 22, 2013
Siemens Aktiengesellschaft, Munich, DE;
Karl Barth, Hoechstadt, DE;
Rainer Graumann, Hoechstadt, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
Artifacts caused by at least one metal object in a target region to be imaged are corrected during the reconstruction of a three-dimensional image dataset from a number of two-dimensional projection images of the target region recorded from different projection directions with an x-ray device. An orientation and position of a three-dimensional model of the known metal object is determined in the coordinate system of the x-ray device via a 2D-3D registration with at least one two-dimensional projection image, after which, for each radiation path of the projection images running through the metal object, on the basis of attenuation information through the metal object assigned to the model, an attenuation portion through the metal object is calculated for the projection image data assigned to the radiation path and is obtained by computation for determining modified projection images from the projection image data. The three-dimensional image dataset is determined from the modified projection images.