The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2015
Filed:
Jun. 02, 2011
Applicants:
Yoriko Kazama, Hanno, JP;
Osamu Nishiguchi, Tokyo, JP;
Masaaki Tanizaki, Nishitokyo, JP;
Inventors:
Assignee:
HITACHI SOLUTIONS, LTD., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06K 9/00 (2006.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
G06K 9/0063 (2013.01); G06K 9/4652 (2013.01);
Abstract
In the case of collecting samples, it is difficult to select a representative point of a target area. Thus, the samples are collected from certain positions, resulting in generation of variations of data. The target area is specified on an image to extract features from the target area. Further, clustering is performed for the features on a feature space to obtain representative features, and the obtained representative features are extracted as sampling points.
Kazama, Yoriko. (2015). Sampling position-fixing system (U.S. Patent No. 9098745). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9098745
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile