The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2015

Filed:

Dec. 01, 2010
Applicants:

Andreas Kemmler, Boenigheim, DE;

Torsten Kamenz, Weisloch, DE;

Inventors:

Andreas Kemmler, Boenigheim, DE;

Torsten Kamenz, Weisloch, DE;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3664 (2013.01); G06F 11/3672 (2013.01);
Abstract

Disclosed embodiments provide a system, machine-readable medium, and a method that may test computer application functions. A system provides for testing a computer application function by analyzing a testing characteristic of the computer application function information. Based on the analysis of the testing characteristic, the computer application function may be activated for testing in any one of a plurality of test environments. The test environment is selected according to the testing characteristic that indicates the effects that the testing of the selected computer application has on the test environment. This allows users to select a test environment based on the effects that it has on a test system.


Find Patent Forward Citations

Loading…