The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2015

Filed:

Jul. 10, 2012
Applicants:

Tadashi Nakamura, Tokyo, JP;

Shingo Tachikawa, Tokyo, JP;

Naoto Watanabe, Kanagawa, JP;

Inventors:

Tadashi Nakamura, Tokyo, JP;

Shingo Tachikawa, Tokyo, JP;

Naoto Watanabe, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 15/14 (2006.01); B41J 27/00 (2006.01); G02B 26/12 (2006.01); B41J 2/47 (2006.01);
U.S. Cl.
CPC ...
G02B 26/123 (2013.01); B41J 2/473 (2013.01);
Abstract

An optical scanning apparatus scans a target surface with a light beam along a main scanning direction. The apparatus includes a light source, an optical deflector which includes a rotating multi-faceted mirror, each surface of the multi-faceted mirror acting as a reflecting surface to deflect the light beam from the light source, and a scanning optical system configured to guide the light beam deflected by the optical deflector to the target surface. An angle which is formed between the light beam toward the reflecting surface of the optical deflector and the corresponding reflecting surface and which includes a reflected light reflected from the corresponding reflecting surface is always obtuse.


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