The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2015
Filed:
Feb. 03, 2010
Yoshitaka Bito, Kokubunji, JP;
Satoshi Hirata, Kodaira, JP;
Hisaaki Ochi, Kodaira, JP;
Koji Hirata, Kasukabe, JP;
Toru Shirai, Kawasaki, JP;
Yosuke Otake, Mitaka, JP;
Yoshitaka Bito, Kokubunji, JP;
Satoshi Hirata, Kodaira, JP;
Hisaaki Ochi, Kodaira, JP;
Koji Hirata, Kasukabe, JP;
Toru Shirai, Kawasaki, JP;
Yosuke Otake, Mitaka, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
In the diffusion spectroscopic imaging, in which intensity of molecular diffusion is imaged with separating chemical substances, with suppressing artifacts resulting from object motion of an object, spatial resolution, spectral band and SNR are maintained, and measurement accuracy is enhanced. A measurement for acquiring diffusion SI data is repeated a plurality of times with changing acquisition timing, phase variation of each measurement result is corrected, and a diffusion SI image is reconstructed from the corrected measurement results. In addition, the phase variation is calculated for every point in the space from the diffusion SI data acquired by each measurement or navigation data obtained by each measurement. The phase correction is independently performed for every point in the space.