The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2015
Filed:
May. 03, 2013
Applicant:
Ut-battelle, Llc, Oak Ridge, TN (US);
Inventors:
Stephen Jesse, Knoxville, TN (US);
Sergei V. Kalinin, Knoxville, TN (US);
Assignee:
UT-Battelle, LLC, Oak Ridge, TN (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 20/00 (2010.01); G01Q 10/06 (2010.01); G01Q 30/04 (2010.01); G01Q 60/32 (2010.01); B82Y 35/00 (2011.01);
U.S. Cl.
CPC ...
G01Q 20/00 (2013.01); G01Q 10/06 (2013.01); G01Q 30/04 (2013.01); G01Q 60/32 (2013.01); B82Y 35/00 (2013.01);
Abstract
Scanning probe microscopy may include a method for generating a band excitation (BE) signal and simultaneously exciting a probe at a plurality of frequencies within a predetermined frequency band based on the excitation signal. A response of the probe is measured across a subset of frequencies of the predetermined frequency band and the excitation signal is adjusted based on the measured response.