The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2015
Filed:
Jun. 29, 2011
Applicants:
Takashi Yamato, Kakogawa, JP;
Hisashi Nakatsuka, Kobe, JP;
Hiroshi Kurono, Kobe, JP;
Inventors:
Assignee:
SYSMEX CORPORATION, Kobi-shi, Hyogo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01); G01N 33/49 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/0092 (2013.01); G01N 2035/0094 (2013.01); Y10T 436/11 (2015.01); Y10T 436/113332 (2015.01); Y10T 436/114165 (2015.01); Y10T 436/114998 (2015.01);
Abstract
An apparatus for generating throughput information of a sample analyzer is disclosed. Specifically, this apparatus generates throughput information of a sample analyzer capable of measuring a sample on a plurality of measurement items in which measurement time differs from each other. The apparatus receives an input of a plurality of measurement orders, wherein a measurement order includes a designation of at least one measurement item, generates the throughput information of the sample analyzer based on the received plurality of measurement orders; and outputs the generated throughput information.